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Monte Carlo method to correct for small-angle scattering in gamma transmission measurements with a NaI(Tl) detector

Van Thi Thu Trang 1, *
Tran Thien Thanh 2
Le Hoang Minh 2
Ngo Truong Phu 2
  1. Department of Nuclear Physics Faculty of Physics and Engineering Physics University of Science, Ho Chi Minh City, Vietnam
Correspondence to: Van Thi Thu Trang, Department of Nuclear Physics Faculty of Physics and Engineering Physics University of Science, Ho Chi Minh City, Vietnam. Email: [email protected].
Volume & Issue: Vol. 29 No. 2 (2026) | Page No.: 4028-4036 | DOI: 10.32508/vnuhcmj-std.v29i2.24584
Published: 2026-05-22

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This article is published with open access by Viet Nam National University, Ho Chi Minh City, Viet Nam. This article is distributed under the terms of the Creative Commons Attribution License (CC-BY 4.0) which permits any use, distribution, and reproduction in any medium, provided the original author(s) and the source are credited.

Abstract

Gamma transmission is a prominent technique for performing nondestructive testing and material analysis, particularly high-precision thickness measurements. However, its accuracy is often compromised by small-angle scattering, in which photons deflected at shallow angles are incorrectly counted by the detector as part of the primary transmitted beam. This is especially pronounced when using common low-resolution scintillation detectors such as NaI(Tl). This study presents a Monte Carlo simulation method, developed with the MCNP-CP software, to correct for the influence of small-angle scattering in gamma transmission measurements. The method is demonstrated using simulations of a standard experimental setup with a 2 × 2 inch NaI(Tl) detector and a collimated gamma-ray beam from three distinct radioisotope sources covering a broad energy spectrum: Co-60 (1173 and 1332 keV), Cs-137 (662 keV), and Am-241 (59.54 keV). By computationally isolating directly transmitted photons from the scattered component, the true linear attenuation coefficients are obtained for various single-element materials, including carbon, copper, and aluminum. The results demonstrate a significant improvement in accuracy; after applying the correction, the calculated attenuation coefficients deviate by less than 3% from the established NIST XCOM reference values, compared with a 6% discrepancy observed without correction. It is also found that the intensity of small-angle scattering has a complex dependence on material thickness, initially increasing to a peak before gradually declining. Analysis of the buildup factor confirms that it has a direct positive correlation with sample thickness, reflecting the increasing contribution of scattered photons in thicker materials. The behavior of the buildup factor is also strongly energy dependent: it is minimal at low energies (Am-241), shows the greatest sensitivity to the collimator’s diameter at intermediate energies (Cs-137), and converges at high energies (Co-60). This work provides a validated method to enhance the precision of gamma-ray measurement systems by compensating for systematic scattering deviations. 

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